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Bilingual technical review of MRAM technology, covering memory hierarchies, MTJ/TMR physics, STT-MRAM, SOT-MRAM, applications, engineering challenges, and future directions.

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MRAM Technology Review

中文说明

A bilingual technical review of magnetoresistive random-access memory (MRAM), covering memory hierarchies, DRAM/SRAM/Flash/HDD, MTJ and TMR physics, STT-MRAM, SOT-MRAM, applications, engineering challenges, and future directions.

Contents

Path Description
source/zh/ Chinese LaTeX source and source figures
source/en/ English LaTeX source and source figures
pdf/mram-report-zh.pdf Compiled Chinese report
pdf/mram-report-en.pdf Compiled English report
figures/redrawn/ Original redrawn MRAM diagrams
figures/web/ Public-source figures used by the reports
docs/ Image source notes and attribution references

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XeLaTeX is required. Compile each language twice so that the table of contents and cross-references are updated:

cd source/zh
xelatex -interaction=nonstopmode -halt-on-error main.tex
xelatex -interaction=nonstopmode -halt-on-error main.tex

cd ../en
xelatex -interaction=nonstopmode -halt-on-error main.tex
xelatex -interaction=nonstopmode -halt-on-error main.tex

The English source uses the standard article class. The Chinese source uses ctexart and should be compiled with XeLaTeX.

Overleaf

Upload either source/zh or source/en as a project and set main.tex as the main file. The corresponding figure_from_web/ directory must remain beside main.tex.

Attribution

The report figures include public-source material from Wikimedia Commons, Fraunhofer IPMS, and Nature Electronics source material. The diagrams in figures/redrawn/ are original redrawings based on public technical references. See docs/MRAM_public_image_links.md for source notes.

Author

Sufeng Guo, School of Integrated Circuits, student ID 231880273.

About

Bilingual technical review of MRAM technology, covering memory hierarchies, MTJ/TMR physics, STT-MRAM, SOT-MRAM, applications, engineering challenges, and future directions.

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